SESSION J Thursday, 2 October
Radiation Hardness Assurance
Chairs: Cristina Plettner & Stefan Hoeffgen
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Queen Elisabeth Hall
J2 11:50 - 12:05
Commercial GaN FETs. Radiation destructive events: Lot-to-lot and intra-lot variability.​
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Authors: M. Perez-cerdan(1), M. Gomez-alonso(2), A. Fernandez-fernandez(2), P. Lopez-cenamor(2), A. Carbone(3), C. Palomar-trives(2), F. Franco(4)
1. Airbus Crisa / Universidad Complutense de Madrid (UCM), Spain, 2. Airbus Crisa, Spain, 3. Airbus France, Italy, 4. Universidad Complutense de Madrid (UCM), Spain
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Presenting author: Miguel Perez-Cerdan
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This research is the beginning of a study on the reliability of gallium nitride (GaN) devices under radiation. Unlike silicon devices, GaN devices exhibit high variability in their radiation performance, both between and within lots.
J3 12:05 - 12:20
Study of TID Response of a Low Cost Motor Board with a System-Level Testing Approach​
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Authors: G. Carpentier(1), J. Boch(2), F. Saigne(2), J. Favrichon(1), E. Cantrel(1), J. Vaille(2), T. Maraine(2), F. Wrobel(2), L. Dilillo(3)
1. CEA, France, 2. Université de Montpellier, IES, France, 3. Université de Montpellier, IES - CNRS, France
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Presenting author: Guillaume Carpentier
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The Total Ionizing Dose response of a motor board is studied with radiation tests performed at system-level. The choice of monitoring parameters is crucial, as they can be used to determine the board's sensitive components.
POSTERS
J1
Ensuring Compliance to Low Cross-Section Destructive SEEs in Particle Accelerator Control System Production Batches: A Large-Sample Testing Approach​
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Authors: R. Ferraro(1), A. Zimmaro(1), A. Scialdone(2), G. Foucard(1), S. Danzeca(3), A. Masi(3)
1. CERN, France, 2. CERN, Italy, 3. CERN, Switzerland
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Presenting author: Rudy Ferraro
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This paper addresses the qualification of control system electronics for destructive Single Event Effects in the CERN accelerator complex, linking environmental constraints and failure rate targets to define test levels for production batch compliance.
PJ-1
Using hardware environment emulation and laser testing for early SEE evaluation of an FPGA design
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Authors: I. Colin(1), V. Pouget(2), F. Wrobel(3), P. Lamberbourg(4), G. Prévond(4), A. De bibikoff(4)
1. Safran Data Systems & Montpellier University, France, 2. IES-CNRS, France, 3. Universite Montpellier, France, 4. Safran Data Systems, France
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Presenting author: Ismael Colin
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We evaluate a method for early SEE evaluation of an FPGA design based on embedded emulation of hardware environment combined with laser testing. Influence of laser scanning parameters on the observed event ratios is explored.
PJ-2
System-Level Risk Assessment for Single-Event Latchup Based on Historical Data
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Authors: R. Ladbury(1), M. Joplin(2)
1. NASA GSFC, USA, 2. NASA Goddard Space Flight Center, USA
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Presenting author: Raymond Ladbury
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A flexible system risk analysis tool based on historical SEL data allows assessment of design and testing strategies even at very early stages. The analysis can be refined as test data become available.
PJ-3
Stochastic Worst-Case Test Vectors for ASIC Devices in Single Event Environment
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Authors: A. Abou-auf(1), M. Abdelrazik(1), M. Mahmoud(2), A. Ibrahim(1), M. Wael(1)
1. The American University in Cairo, Egypt, 2. Cairo Univeristy, Egypt
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Presenting author: Ahmed Abou-Auf
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A novel stochastic algorithm to identify worst-case vectors in ASIC devices under a single event environment. This new approach utilizes a novel methodology to determine probability of failure in ASICs under a single event environment
PJ-4
Complementary single event evaluation method that combines pulse−laser and heavy−ion results for radiation hardness verification of space COTS upscreen
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Authors: H. Lee(1)
1. QRT Inc, Korea, Republic of
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Presenting author: Hyeokjae Lee
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In this article, we present a new evaluation method called the complementary single event evaluation method, which hybridizes pulse-laser and heavy-ion test results for radiation hardness with space COTS up-screen.